top of page

Equipment List

  • Femtosecond laser system with tunable excitation wavelength for ultrafast time-resolved transient absorption and fluorescence measurements (Spectra-physics; Ultrafast systems Helios and Halcyone) (Funded by JLFS/P-704/18; HKD 3,000,000)

  • Quanta Ray GCR 150-10 pulsed Nd:YAG laser system (355 nm) for emission lifetime measurement

  • Sublimation system for OLED materials purification (CreaPhys DSU-05)

  • Microwave Synthesis Reactor (Anton Paar Monowave 400)

  • LED photoreactor (Wattcas WP-TEC-1020HSL)

  • Xenon arc light source (Newport 66485-300XV-R1; Asahi Spectra Max-303)

  • Vacuum deposition system for OLED fabrication (Kurt J. Lesker SPECTROS)

  • Scanning electron microscopy (SEM)

  • Charge Mobility Measuring System: for measuring charge mobility of thin-film transistors

  • Voltage-Current Density-Brightness (V-I-B) Measuring System: for characteristic of electroluminescent devices

  • Solid-State/Hydrothermal Synthesis Equipment (ovens, reactors etc.)

  • Bruker D8 VENTURE single-crystal X-ray diffractometer (SCXRD) with a MetalJet D2 liquid gallium X-ray source (lGaKα = 1.34139Ǻ), a Kappa four-circle goniometer, and a PHOTON II CPAD detector. This instrument is suitable for challenging single-crystal samples such as micron-sized, MOF, and biological macromolecule crystals.

  • Inert atmosphere dry box for handling air-sensitive compounds

  • UV-visible spectrophotometers (Agilent 8453; Agilent Cary 60)

  • Spectrofluorometer (Horiba, Fluorolog-3)

  • Absolute photoluminescence quantum yield spectrometer (Hamamatsu C11347-11)

bottom of page